Published March 28, 2006 | Version v1
Patent Open

Methods and measurement engine for aligning multi-projector display systems

  • 1. Argonne National Laboratory

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Description

An image pattern description is stored and tiled display test pattern images are captured. The stored image pattern description and at least one captured tiled display test pattern image are used to identify a tile array placement and layout; a tile registration measurement; and a dot grid measurement providing measured dot grid positions. At least one captured tiled display test pattern images and the measured dot grid positions are used for calculating tile-to-camera maps and a camera-to-mural map. The tile-to-camera maps and the camera-to-mural map are used to generate control and correction data.

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Additional details

Identifiers

Patent application number
US 28371902 A
Patent number
US 7019713 B2
Other
oai:uchicago.tind.io:8870

Dates

Patent filed
2002-10-30

UChicago Information

Division(s)
Physical Sciences Division
Department(s)
Chemistry