Published September 4, 2001 | Version v1
Patent Open

Optical method and apparatus for detection of defects and microstructural changes in ceramics and ceramic coatings

  • 1. Argonne National Laboratory

Contributors

Patent applicant:

Patent assignee:

Description

Apparatus detects defects and microstructural changes in hard translucent materials such as ceramic bulk compositions and ceramic coatings such as after use under load conditions. The beam from a tunable laser is directed onto the sample under study and light reflected by the sample is directed to two detectors, with light scattered with a small scatter angle directed to a first detector and light scattered with a larger scatter angle directed to a second detector for monitoring the scattering surface. The sum and ratio of the two detector outputs respectively provide a gray-scale, or "sum" image, and an indication of the lateral spread of the subsurface scatter, or "ratio" image. This two detector system allows for very high speed crack detection for on-line, real-time inspection of damage in ceramic components. Statistical image processing using a digital image processing approach allows for the quantative discrimination of the presence and distribution of small flaws in a sample while improving detection reliability. The tunable laser allows for the penetration of the sample to detect defects from the sample's surface to the laser's maximum depth of penetration. A layered optical fiber directs the incoming laser beam to the sample and transmits each scattered signal to a respective one of the two detectors.

Files

US6285449.pdf

Files (1.0 MB)

Name Size Download all
md5:98a7a569bc1dfbedf93f193743bdacef
1.0 MB Preview Download

Additional details

Identifiers

Patent application number
US 33072799 A
Patent number
US 6285449 B1
Other
oai:uchicago.tind.io:8682

Dates

Patent filed
1999-06-11

UChicago Information

Division(s)
Physical Sciences Division
Department(s)
Physics