Published March 16, 2006 | Version v1
Patent Open

Method for detection and imaging over a broad spectral range

Description

A method of controlling the coordinate sensitivity in a superconducting microbolometer employs localized light, heating or magnetic field effects to form normal or mixed state regions on a superconducting film and to control the spatial location. Electron beam lithography and wet chemical etching were applied as pattern transfer processes in epitaxial Y-Ba-Cu-O films. Two different sensor designs were tested: (i) a 3 millimeter long and 40 micrometer wide stripe and (ii) a 1.25 millimeters long, and 50 micron wide meandering-like structure. Scanning the laser beam along the stripe leads to physical displacement of the sensitive area, and, therefore, may be used as a basis for imaging over a broad spectral range. Forming the superconducting film as a meandering structure provides the equivalent of a two-dimensional detector array. Advantages of this approach are simplicity of detector fabrication, and simplicity of the read-out process requiring only two electrical terminals.

Files

US20060058196.pdf

Files (387.5 kB)

Name Size Download all
md5:ab2cdfe6ad14e9aa12b034e41c9ad702
387.5 kB Preview Download

Additional details

Identifiers

Patent number
US 19078405 A
Patent application number
US 2006/0058196 A1
Other
oai:uchicago.tind.io:9393

Dates

Patent filed
2005-07-27

UChicago Information

Division(s)
Physical Sciences Division
Department(s)
Physics, Chemistry