Published November 21, 1995 | Version v1
Patent Open

Millimeter wave sensor for monitoring effluents

Description

A millimeter-wave sensor for detecting and measuring effluents from processing plants either remotely or on-site includes a high frequency signal source for transmitting frequency-modulated continuous waves in the millimeter or submillimeter range with a wide sweep capability and a computer-controlled detector for detecting a plurality of species of effluents on a real time basis. A high resolution spectrum of an effluent, or effluents, is generated by a deconvolution of the measured spectra resulting in a narrowing of the line widths by 2 or 3 orders of magnitude as compared with the pressure broadened spectra detected at atmospheric pressure for improved spectral specificity and measurement sensitivity. The sensor is particularly adapted for remote monitoring such as where access is limited or sensor cost restricts multiple sensors as well as for large area monitoring under nearly all weather conditions.

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Additional details

Identifiers

Patent application number
US 26299894 A
Patent number
US 5468964 A
Other
oai:uchicago.tind.io:8749

Dates

Patent filed
1994-06-20

UChicago Information

Division(s)
Physical Sciences Division
Department(s)
Physics