Published September 30, 2004 | Version v1
Patent Open

Automated method and system for advanced non-parametric classification of medical images and lesions

  • 1. University of Chicago

Contributors

Patent applicant:

Description

A computer-aided diagnosis (CAD) scheme to aid in the detection, characterization, diagnosis, and/or assessment of normal and diseased states (including lesions and/or images). The scheme employs lesion features for characterizing the lesion and includes non-parametric classification, to aid in the development of CAD methods in a limited database scenario to distinguish between malignant and benign lesions. The non-parametric classification is robust to kernel size.

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Additional details

Identifiers

Patent application number
US 72439503 A
Patent number
US 7298883 B2
Other
oai:uchicago.tind.io:8712

Dates

Patent filed
2003-12-01

UChicago Information

Division(s)
Biological Sciences Division
Department(s)
Radiology