Published December 20, 2023
| Version v1
Journal article
Open
Machine learning for automated experimentation in scanning transmission electron microscopy
Creators
- 1. University of Tennessee, Knoxville
- 2. Oak Ridge National Laboratory
- 3. University of Chicago
- 4. Pacific Northwest National Laboratory
- 5. Drexel University
Description
Machine learning (ML) has become critical for post-acquisition data analysis in (scanning) transmission electron microscopy, (S)TEM, imaging and spectroscopy. An emerging trend is the transition to real-time analysis and closed-loop microscope operation. The effective use of ML in electron microscopy now requires the development of strategies for microscopy-centric experiment workflow design and optimization. Here, we discuss the associated challenges with the transition to active ML, including sequential data analysis and out-of-distribution drift effects, the requirements for edge operation, local and cloud data storage, and theory in the loop operations. Specifically, we discuss the relative contributions of human scientists and ML agents in the ideation, orchestration, and execution of experimental workflows, as well as the need to develop universal hyper languages that can apply across multiple platforms. These considerations will collectively inform the operationalization of ML in next-generation experimentation.
Data availability
Since, this is a perspective, all data pertaining to this is available from the individual manuscripts cited, depending upon their data sharing policies.Files
Machine-learning-for-automated-experimentation-in-scanning-transmission-electron-microscopy.pdf
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Additional details
Identifiers
- DOI
- 10.1038/s41524-023-01142-0
- Other
- oai:uchicago.tind.io:10238
Funding
- U.S. Department of Energy
- DE-AC05-00OR22725
- UT Knoxville
- start-up funding
- U.S. Department of Energy
- Battelle Memorial Institute
- National Science Foundation
- OAC:DMR:CSSI – 2246463
- U.S. Department of Energy
- Office of Science, Office of Advanced Scientific Computing Research
- U.S. Department of Commerce
- National Institute of Standards and Technology