Published December 24, 2020 | Version v1
Patent Open

Electrometry by Optical Charge Conversion of Defects in the Solid-State

Contributors

Patent applicant:

Description

Methods and systems are disclosed for sensing an environment electric field. In one exemplary implementation, a method includes disposing a sensor in the environment, wherein the sensor comprising a crystalline lattice and at least one optically-active defect in the crystalline lattice; pre-exciting the crystalline lattice to prepare at least one defect in a first charge state using a first optical beam at a first optical wavelength; converting at least one defect from the first charge state to a second charge state using a second optical beam at a second optical wavelength; monitoring a characteristics of photoluminescence emitted from the defect during or after the conversion of the at least one defect from the first charge state to the second charge state; and determining a characteristics of the electric field in the environment according to the monitored characteristics of the photoluminescence.

Files

US20200400723.pdf

Files (1.5 MB)

Name Size Download all
md5:79f3258f094d9c7fe2c4062e5459b0d3
1.5 MB Preview Download

Additional details

Identifiers

Patent application number
US 201916968471 A
Patent number
US 2020/0400723 A1
Other
oai:uchicago.tind.io:8172

Dates

Patent filed
2019-02-13

UChicago Information

Division(s)
Pritzker School of Molecular Engineering