Published December 27, 2007 | Version v1
Patent Open

Method for analyzing multi-layer materials from one-sided pulsed thermal imaging

  • 1. Argonne National Laboratory

Contributors

Patent applicant:

Patent assignee:

Description

A method, apparatus, and computer program product provides automated analysis of thermal imaging data for multi-layer materials based upon a theoretical model of a multi-layer material system, which is solved numerically. The computer-implemented method effectively processes the volume heating effect for thermal barrier coatings (TBCs), since quantitative evaluation of TBC thickness and conductivity is particularly important. TBC thickness is a processing parameter and required to be monitored. TBC conductivity is a measure of TBC quality because it is directly related with TBC density/porosity, microcracking and interface cracks. Because this method is an imaging technology, it can be used for fast and 100% area inspection of larger TBC surfaces, such as combustor liners.

Files

US20070299628.pdf

Files (501.2 kB)

Name Size Download all
md5:f652ad9e658f943f40d60828c3173571
501.2 kB Preview Download

Additional details

Identifiers

Patent application number
US 45205206 A
Patent number
US 2007/0299628 A1
Other
oai:uchicago.tind.io:9353

Dates

Patent filed
2006-06-13

UChicago Information

Division(s)
Physical Sciences Division
Department(s)
Physics