Published May 24, 2022
| Version v1
Patent
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Systems and methods for interferometric multifocus microscopy
Creators
- 1. Northwestern University
- 2. University of Chicago
- 3. Argonne National Laboratory
Contributors
Patent applicants:
Description
A system to generate image representations includes a first objective that receives a first light beam emitted from a sample and a second objective that receives a second light beam emitted from the sample, where the first light beam and the second light beam have conjugate phase. The system also includes a first diffractive element to receive the first light beam and separate it into a first plurality of diffractive light beams that are spatially distinct, and a second diffractive element to receive the second light beam and separate it into a second plurality of diffractive light beams that are spatially distinct. The system further includes a detector that receives the first and second plurality of diffractive light beams. The first plurality of diffractive light beams and the second plurality of diffractive light beams are simultaneously directed and focused onto different portions of an image plane of the detector.
Files
US11340057.pdf
Files
(1.6 MB)
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Additional details
Identifiers
- Patent number
- US 11340057 B2
- Patent application number
- US 201915734172 A
- Other
- oai:uchicago.tind.io:7363
Dates
- Patent filed
-
2019-06-21